[clug] Effect of operating temps on life of integrated circuits

steve jenkin sjenkin at canb.auug.org.au
Sat Feb 13 20:47:07 MST 2010

steve jenkin wrote on 23/01/10 6:32 PM:
> I've been trying to track down any estimates/rules-of-thumb about
> the effect of increased junction temperature on expected lifetime of
> IC's like CPU's and RAM - and was hoping the Collective Wisdom of
> CLUG (and some better Google-Fu than mine) could come up with
> quotable figures.

An answer to the source of the "internal 10°C increase halves life"


> Stupid Thing No. 9.  Reducing temperature because "every 10°C drop
> doubles the life." This is still the gospel of the land. It started
> with the U.S. Department of Defense Military Handbook 217, which
> became the standard for electronics reliability. The 10°C rule was
> part of it.


Article (2007?) on need for an update of MIL-HDBK-217 & "VITA 51".

Intro to "MIL-HDBK-217 Reliability Prediction"

MIL-HDBK-217F - download. 322pp, 19Mb. dated "2-Dec-1991". OCR'd doc.

Microcircuits [incl. RAM, Microprocessors] p 5-1. (pp120 in PDF)
p152 in PDF has a table of temperature factors. Includes VHSIC CMOS.
Worked Examples 5-20 (p159 in PDF)
Appendix B (p311 of PDF) and Reference 30 (p319 of PDF) are cited for
more detail on VLSI CMOS.

Steve Jenkin, Info Tech, Systems and Design Specialist.
0412 786 915 (+61 412 786 915)
PO Box 48, Kippax ACT 2615, AUSTRALIA

sjenkin at canb.auug.org.au http://members.tip.net.au/~sjenkin

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